Skip to content
MyTheses
Feedback
Book Bag:
0
items
(Full)
HOME
MYTHESES
BLOG
AI ASSISTANT
INSTITUTION
GUIDE & TUTORIAL
CONTACT
Language
English
Français
日本語
中文(简体)
中文（繁體）
اللغة العربية
हिंदी
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Object-oriented test pattern g...
Cite this
Text this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Add to Book Bag
Remove from Book Bag
Permanent link
Object-oriented test pattern generator and logic simulator for combinational circuits
Bibliographic Details
Main Author:
Ooi, Chia Yee
Format:
Thesis
Published:
2003
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
Holdings
Description
Similar Items
Staff View
Similar Items
An object-oriented digital circuit simulator
by: Khairuddin, Alawidin
Published: (1993)
Modified pattern generator of built-in self test for sequential circuits with reduced test time
by: Muhamad Amin, Muhamad Ridzuan Radin
Published: (2011)
Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing
by: Alamgir, Arbab
Published: (2022)
Simulation of in-memory logic circuit based on probabilistic memristor using LTSPICE
by: Ng, Yuh Chyn
Published: (2022)
CNFET-based design ternary logic design and arithmetic circuit simulation using HSPICE
by: Ee, Poey Guan
Published: (2015)
