APA(7版)引用形式

Kamisian, I. (2000). Random power supply as a test vector to expose soft defects in CMOS digital circuits.

Chicagoスタイル(17版)引用形式

Kamisian, Izam. Random Power Supply as a Test Vector to Expose Soft Defects in CMOS Digital Circuits. 2000.

MLA(9版)引用形式

Kamisian, Izam. Random Power Supply as a Test Vector to Expose Soft Defects in CMOS Digital Circuits. 2000.

警告: この引用は必ずしも正確ではありません.