APA引文

Kamisian, I. (2000). Random power supply as a test vector to expose soft defects in CMOS digital circuits.

Chicago Style (17th ed.) Citation

Kamisian, Izam. Random Power Supply as a Test Vector to Expose Soft Defects in CMOS Digital Circuits. 2000.

MLA引文

Kamisian, Izam. Random Power Supply as a Test Vector to Expose Soft Defects in CMOS Digital Circuits. 2000.

警告：這些引文格式不一定是100％准確.