Random power supply as a test vector to expose soft defects in CMOS digital circuits
| 第一著者: | |
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| フォーマット: | 学位論文 |
| 出版事項: |
2000
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| 主題: |
| _version_ | 1846217006782611456 |
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| author | Kamisian, Izam |
| author_facet | Kamisian, Izam |
| author_sort | Kamisian, Izam |
| format | Thesis |
| id | uthm-43626 |
| institution | Universiti Teknologi Malaysia |
| publishDate | 2000 |
| record_format | eprints |
| spelling | uthm-436262014-11-02T03:35:37Z http://eprints.utm.my/43626/ Random power supply as a test vector to expose soft defects in CMOS digital circuits Kamisian, Izam TK Electrical engineering. Electronics Nuclear engineering 2000 Thesis NonPeerReviewed Kamisian, Izam (2000) Random power supply as a test vector to expose soft defects in CMOS digital circuits. Masters thesis, Universiti Teknologi Malaysia, Faculty of Electrical Engineering. |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Kamisian, Izam Random power supply as a test vector to expose soft defects in CMOS digital circuits |
| title | Random power supply as a test vector to expose soft defects in CMOS digital circuits |
| title_full | Random power supply as a test vector to expose soft defects in CMOS digital circuits |
| title_fullStr | Random power supply as a test vector to expose soft defects in CMOS digital circuits |
| title_full_unstemmed | Random power supply as a test vector to expose soft defects in CMOS digital circuits |
| title_short | Random power supply as a test vector to expose soft defects in CMOS digital circuits |
| title_sort | random power supply as a test vector to expose soft defects in cmos digital circuits |
| topic | TK Electrical engineering. Electronics Nuclear engineering |
| url-record | http://eprints.utm.my/43626/ |
| work_keys_str_mv | AT kamisianizam randompowersupplyasatestvectortoexposesoftdefectsincmosdigitalcircuits |