Random power supply as a test vector to expose soft defects in CMOS digital circuits

مواد مشابهة

• Analysis on layout dependent defects of CMOS digital circuit
  حسب: Mat Safri, Norlaili
  منشور في: (1999)
• Low power cmos potentiometric circuit design for label-free DNA detection
  حسب: Khalid, Muhammad Harris
  منشور في: (2019)
• Test vectors reductoin for integrated circuit testing using horizontal hamming distance
  حسب: Alamgir, Arbab
  منشور في: (2016)
• Fault Analysis And Test For Bridge Defect In Resistive Random Access Memory
  حسب: Arshad, Norsuhaidah
  منشور في: (2016)
• Development of Test Procedure For CMOS Operational Amplifier Application Circuits
  حسب: Abdul Halin, Izhal
  منشور في: (2002)