Random power supply as a test vector to expose soft defects in CMOS digital circuits
| 第一著者: | Kamisian, Izam |
|---|---|
| フォーマット: | 学位論文 |
| 出版事項: |
2000
|
| 主題: |
類似資料
Analysis on layout dependent defects of CMOS digital circuit
著者:: Mat Safri, Norlaili
出版事項: (1999)
著者:: Mat Safri, Norlaili
出版事項: (1999)
Low power cmos potentiometric circuit design for label-free DNA detection
著者:: Khalid, Muhammad Harris
出版事項: (2019)
著者:: Khalid, Muhammad Harris
出版事項: (2019)
Test vectors reductoin for integrated circuit testing using horizontal hamming distance
著者:: Alamgir, Arbab
出版事項: (2016)
著者:: Alamgir, Arbab
出版事項: (2016)
Fault Analysis And Test For Bridge Defect In Resistive Random Access Memory
著者:: Arshad, Norsuhaidah
出版事項: (2016)
著者:: Arshad, Norsuhaidah
出版事項: (2016)
Development of Test Procedure For CMOS Operational Amplifier Application Circuits
著者:: Abdul Halin, Izhal
出版事項: (2002)
著者:: Abdul Halin, Izhal
出版事項: (2002)
Digital modelling test technique for mixed mode circuits
著者:: Leong, Mun Hon
出版事項: (2005)
著者:: Leong, Mun Hon
出版事項: (2005)
An object-oriented digital circuit simulator
著者:: Khairuddin, Alawidin
出版事項: (1993)
著者:: Khairuddin, Alawidin
出版事項: (1993)
Computer Vision Inspection And Classification On Printed Circuit Boards For Flux Defects
著者:: Ang, Teoh Ong
出版事項: (2016)
著者:: Ang, Teoh Ong
出版事項: (2016)
Digital logic circuit design using adiabatic approach
著者:: Zainal Abidin, Nurul Aisyah Nadiah
出版事項: (2017)
著者:: Zainal Abidin, Nurul Aisyah Nadiah
出版事項: (2017)
Design And Simulation Of Cmos-Based Bandgap Reference Voltage With Compensation Circuit Using 0.18 Μm Process Technology
著者:: Chan, Mun kit
出版事項: (2017)
著者:: Chan, Mun kit
出版事項: (2017)
Modified pattern generator of built-in self test for sequential circuits with reduced test time
著者:: Muhamad Amin, Muhamad Ridzuan Radin
出版事項: (2011)
著者:: Muhamad Amin, Muhamad Ridzuan Radin
出版事項: (2011)
Design of a low-noise low-power front-end readout circuit for neutron detection using 130nm CMOS technology
著者:: Aimaier, Nueraimaiti
出版事項: (2015)
著者:: Aimaier, Nueraimaiti
出版事項: (2015)
Modeling and vector control of three-phase induction motor when two phases of the stator are open circuit
著者:: Asgari, Seyedhesam
出版事項: (2014)
著者:: Asgari, Seyedhesam
出版事項: (2014)
Design and analysis of electrical testing probe for semiconductor integrated circuit
著者:: Wong, Michael Loke Peng
出版事項: (2016)
著者:: Wong, Michael Loke Peng
出版事項: (2016)
Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing
著者:: Alamgir, Arbab
出版事項: (2022)
著者:: Alamgir, Arbab
出版事項: (2022)
Object-oriented test pattern generator and logic simulator for combinational circuits
著者:: Ooi, Chia Yee
出版事項: (2003)
著者:: Ooi, Chia Yee
出版事項: (2003)
Design and implementation of a power factor correction (PFC) circuit
著者:: Sahid, Mohd. Rodhi
出版事項: (2003)
著者:: Sahid, Mohd. Rodhi
出版事項: (2003)
Low noise and low power ECG amplifier using cmos 0.13μm technology
著者:: Kamaruzzaman, Zulfadli
出版事項: (2018)
著者:: Kamaruzzaman, Zulfadli
出版事項: (2018)
Gate oxide short (gos) defect modeling based on 32 nm CMOS process
著者:: Alawey, Sahar Z
出版事項: (2014)
著者:: Alawey, Sahar Z
出版事項: (2014)
The Design of Low Power CMOS SRAM Subsystems
著者:: Lee, Chu Liang
出版事項: (2001)
著者:: Lee, Chu Liang
出版事項: (2001)
Relationship between cone penetration test and undrained shear strength of soft soil
著者:: Ahmed Nasroulla, Nazaneen
出版事項: (2014)
著者:: Ahmed Nasroulla, Nazaneen
出版事項: (2014)
Design of 8-Bit CMOS Digital to Analog Converter
著者:: Tan, Gim Heng
出版事項: (2001)
著者:: Tan, Gim Heng
出版事項: (2001)
Microprocessor Solder Bump Bridging Defects Screening Strategy In Manufacturing Test Flow
著者:: Loo , Kean Ann
出版事項: (2017)
著者:: Loo , Kean Ann
出版事項: (2017)
Defect detection on electrical power equipment using thermal imaging technology
著者:: Geoffrey, Ogadimma Asiegbu
出版事項: (2013)
著者:: Geoffrey, Ogadimma Asiegbu
出版事項: (2013)
Power transfer allocation using radial equivalent independent circuits method
著者:: Zeynal, Hossein
出版事項: (2007)
著者:: Zeynal, Hossein
出版事項: (2007)
The design of calibration circuit for analog-to-digital converter (ADC).
著者:: S. Mohideen Ali , Mohammad Ariff
出版事項: (2016)
著者:: S. Mohideen Ali , Mohammad Ariff
出版事項: (2016)
Graphene nanoribbon based CMOS modelling
著者:: Jameil, Ahmed K.
出版事項: (2012)
著者:: Jameil, Ahmed K.
出版事項: (2012)
Gloves holes defect evaluation by using electronic air leak testing machine
著者:: Md Din, Mohd Lizan
出版事項: (2017)
著者:: Md Din, Mohd Lizan
出版事項: (2017)
Multistage Power Amplifier In 180nm Cmos Technology With Integrated Passive Linearizer For IEEE 802.15
Application
著者:: Gunasegaran, Premmilaah
出版事項: (2018)
著者:: Gunasegaran, Premmilaah
出版事項: (2018)
Development of a Functional Digital Integrated Circuit Testing System Using Mixed-Mode Technique
著者:: Md. Abubaker Sheikh, Md. Liakot Ali
出版事項: (2004)
著者:: Md. Abubaker Sheikh, Md. Liakot Ali
出版事項: (2004)
Improvement On Rectification And Regulation Of Power Conditioning Circuit For RF Energy Harvesting
著者:: Asli, Astrie Nurasyeila Fifie
出版事項: (2020)
著者:: Asli, Astrie Nurasyeila Fifie
出版事項: (2020)
An Efficient Architecture of 8-Bit CMOS Analog-To-Digital Converter
著者:: Tan, Philip Beow Yew
出版事項: (2000)
著者:: Tan, Philip Beow Yew
出版事項: (2000)
Simulation, Design and Construction of a 15 Kv Dc Power Supply Using Voltage Multiplier Circuits
著者:: Karim, Anayet
出版事項: (2005)
著者:: Karim, Anayet
出版事項: (2005)
Low Power And High Efficiency Rectifying Circuit For Piezoelectric Energy Harvesting Applications
著者:: Mustapha, Ain Atiqa
出版事項: (2016)
著者:: Mustapha, Ain Atiqa
出版事項: (2016)
Design And Development Of Power Conditioning Circuit For Impact-Based Piezoelectric Energy Harvester
著者:: Ahmad Nawir, Nur Amalina
出版事項: (2020)
著者:: Ahmad Nawir, Nur Amalina
出版事項: (2020)
Classification algorithms for six types of defects on bare printed circuit boards
著者:: Ibrahim, Ismail
出版事項: (2011)
著者:: Ibrahim, Ismail
出版事項: (2011)
An Automated Dna Strands Detection System Featuring 32-Bit Arm7tdmi Microcontroller And Vga-Cmos Digital Image Sensor.
著者:: Mohd Noor, Mohd Halim
出版事項: (2009)
著者:: Mohd Noor, Mohd Halim
出版事項: (2009)
On-Chip Power Management System Based CMOS Reconfigurable Switched Capacitor DC-DC Converter For Battery-Less Iot Soc
著者:: Mohd Kamel, Mohamad Khairul
出版事項: (2019)
著者:: Mohd Kamel, Mohamad Khairul
出版事項: (2019)
Design and development of thermoelectric powered wireless sensor network using soft start approach
著者:: Chen, Wei Ping
出版事項: (2021)
著者:: Chen, Wei Ping
出版事項: (2021)
Defect prediction model for testing phase
著者:: Mohamed Suffian, Muhammad Dhiauddin
出版事項: (2009)
著者:: Mohamed Suffian, Muhammad Dhiauddin
出版事項: (2009)
類似資料
-
Analysis on layout dependent defects of CMOS digital circuit
著者:: Mat Safri, Norlaili
出版事項: (1999) -
Low power cmos potentiometric circuit design for label-free DNA detection
著者:: Khalid, Muhammad Harris
出版事項: (2019) -
Test vectors reductoin for integrated circuit testing using horizontal hamming distance
著者:: Alamgir, Arbab
出版事項: (2016) -
Fault Analysis And Test For Bridge Defect In Resistive Random Access Memory
著者:: Arshad, Norsuhaidah
出版事項: (2016) -
Development of Test Procedure For CMOS Operational Amplifier Application Circuits
著者:: Abdul Halin, Izhal
出版事項: (2002)