Die defect classification using image processing

This work presents die defect classification using image processing. The detection of the flaw is based on the defect features in the die. Each unique defect or feature structure is defined from samples that has been collected by Visual Inspection Inspectors. The defects are then grouped into user d...

وصف كامل

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Maniam, Darmadevaindra
التنسيق:	أطروحة
اللغة:	الإنجليزية
منشور في:	2015
الموضوعات:	TK Electrical engineering. Electronics Nuclear engineering
الوصول للمادة أونلاين:	http://eprints.utm.my/53921/1/DarmadevaindraManiamMFKE2015.pdf

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