Die defect classification using image processing

This work presents die defect classification using image processing. The detection of the flaw is based on the defect features in the die. Each unique defect or feature structure is defined from samples that has been collected by Visual Inspection Inspectors. The defects are then grouped into user d...

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Détails bibliographiques
Auteur principal:	Maniam, Darmadevaindra
Format:	Thèse
Langue:	anglais
Publié:	2015
Sujets:	TK Electrical engineering. Electronics Nuclear engineering
Accès en ligne:	http://eprints.utm.my/53921/1/DarmadevaindraManiamMFKE2015.pdf

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