Die defect classification using image processing

This work presents die defect classification using image processing. The detection of the flaw is based on the defect features in the die. Each unique defect or feature structure is defined from samples that has been collected by Visual Inspection Inspectors. The defects are then grouped into user d...

書目詳細資料
主要作者:	Maniam, Darmadevaindra
格式:	Thesis
語言:	英语
出版:	2015
主題:	TK Electrical engineering. Electronics Nuclear engineering
在線閱讀:	http://eprints.utm.my/53921/1/DarmadevaindraManiamMFKE2015.pdf

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