Die defect classification using image processing
This work presents die defect classification using image processing. The detection of the flaw is based on the defect features in the die. Each unique defect or feature structure is defined from samples that has been collected by Visual Inspection Inspectors. The defects are then grouped into user d...
| 第一著者: | |
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| フォーマット: | 学位論文 |
| 言語: | 英語 |
| 出版事項: |
2015
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| 主題: | |
| オンライン･アクセス: | http://eprints.utm.my/53921/1/DarmadevaindraManiamMFKE2015.pdf |