Hybrid constraint-based test pattern generation

The role of testing in Integrated circuit (IC) is to determine the correctness of manufactured circuits. Therefore, testing is important since the fraction of good chips sold in the market yields the quality of the product. Automatic test equipment (ATE) is equipment that used in manufacturing test....

詳細記述

書誌詳細

第一著者:	Abdullah, Ayub Chin
フォーマット:	学位論文
言語:	英語
出版事項:	2013
主題:	TK Electrical engineering. Electronics Nuclear engineering
オンライン･アクセス:	http://eprints.utm.my/78117/1/AyubChinAbdullahMFKE20131.pdf