Automatic model - based test case generation for uml diagrams using tree travelsal algorithm

• 第一著者: Oluwatolani, Oluwagbemi
• フォーマット: 学位論文
• 言語: 英語
• 出版事項: 2016
• 主題: QA75 Electronic computers. Computer science
• オンライン･アクセス: http://eprints.utm.my/78387/1/OluwagbemiOluwatolaniPFC2016.pdf

The foundation of any model-based testing (MBT) with Unified Modelling Language (UML) diagrams is test case generation (TCG) which predicts the expected functionalities of a system under test (SUT). However, problems associated with existing test case generation methods are lack of integration with various UML diagrams and tools, inability to cover all the model elements of UML diagrams, failure to generate comprehensive test cases based on adequate coverage criteria and lack of support tools for automatic generation of test cases. To address these challenges, efficient mapping strategies for model elements that engenders effective artefacts extraction and test case generation processes were proposed. The methodology employed in this research comprised constructing relevant models and algorithms as well as implementing with the use of Java programming language. Specifically, an enhanced elements mapper, artefacts extractor (parser) and test case generator were developed and integrated to produce the support tool. The elements mapper yielded an accuracy result of 99.31%. The artefacts extractor recorded 99.64% accuracy while the test case generator recorded 100% accuracy. The improved methods proved to be more robust and efficiently generated quality test cases with eliminated redundancies based on all the descriptive attributes of UML diagrams. Limitations of existing the methods were addressed in the proposed method which is able to integrate more diagrams to generate quality test cases.