Structural and electrical conductivity measurement of zinc oxide thin film prepared by sol-gel dip coating method
Zinc oxide (ZnO) exhibits a hexagonal wurtzitic structure with a wide direct energy band gap of 3.37 eV. Furthermore, the ZnO thin films have low resistivity and high transparency in visible region and thus can be used as the fundamental layer in the fabrication of optoelectronic devices and as the...
| المؤلف الرئيسي: | |
|---|---|
| التنسيق: | أطروحة |
| اللغة: | الإنجليزية |
| منشور في: |
2015
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| الموضوعات: | |
| الوصول للمادة أونلاين: | http://eprints.utm.my/81443/1/PehLyTatMFS2015.pdf |