Electric field emissions of FPGA chip based on gigahertz transverse electromagnetic cell modeling and measurements
Modern integrated circuits (ICs) are significant sources of undesired electromagnetic wave. Therefore, characterization of chip-level emission is essential to comply with EMC tests at the product level. A Gigahertz Transverse Electromagnetic (GTEM) cell is a common test instrument used to measure IC...
| المؤلف الرئيسي: | |
|---|---|
| التنسيق: | أطروحة |
| اللغة: | الإنجليزية الإنجليزية الإنجليزية |
| منشور في: |
2016
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| الموضوعات: | |
| الوصول للمادة أونلاين: | http://eprints.uthm.edu.my/815/ |
| Abstract | Abstract here |
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Electric field emissions of FPGA chip based on gigahertz transverse electromagnetic cell modeling and measurements
منشور في 2016
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أطروحة
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Universiti Tun Hussein Onn Malaysia