An efficient march (5n) FSM-based Memory Built-in Self-Test (MBIST) architecture with diagnosis capabilities

In deep submicron Systems-on-Chip, embedded memories are consuming a growing part of the die area. The manufacturing test of embedded memory is a critical stage in the SoC production process that screens out faulty chips and speeds up the volume production of new manufacturing technology. Memory Bui...

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書目詳細資料

主要作者:	Ng, Kok Heng
格式:	Thesis
語言:	英语
出版:	2022
主題:	TK Electrical engineering. Electronics Nuclear engineering
在線閱讀:	http://eprints.utm.my/99546/1/NgKokHengMSKE2022.pdf