An efficient march (5n) FSM-based Memory Built-in Self-Test (MBIST) architecture with diagnosis capabilities

In deep submicron Systems-on-Chip, embedded memories are consuming a growing part of the die area. The manufacturing test of embedded memory is a critical stage in the SoC production process that screens out faulty chips and speeds up the volume production of new manufacturing technology. Memory Bui...

पूर्ण विवरण

ग्रंथसूची विवरण

मुख्य लेखक:	Ng, Kok Heng
स्वरूप:	थीसिस
भाषा:	अंग्रेज़ी
प्रकाशित:	2022
विषय:	TK Electrical engineering. Electronics Nuclear engineering
ऑनलाइन पहुंच:	http://eprints.utm.my/99546/1/NgKokHengMSKE2022.pdf