Free space microwave characterization of silicon wafers for microelectronic applications

AWANG, ZAIKI BIN (2004) Free space microwave characterization of silicon wafers for microelectronic applications. UNSPECIFIED.

Full text not available from this repository.

Metadata

Item Type:	Other
PRISMA ID:	4498
URI:	http://oarr.uitm.edu.my/id/eprint/11223

Actions (login required)

View Item

Citation