Free Space Microwave Characterization of Si Wafers for Microelectronic Applications

BABA, NOOR HASIMAH BINTI (2004) Free Space Microwave Characterization of Si Wafers for Microelectronic Applications. UNSPECIFIED.

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Item Type:	Other
PRISMA ID:	10046
URI:	http://oarr.uitm.edu.my/id/eprint/11883

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