Electrical and Material Characterization of 0.24 micron CMOS Device by using Simulation

RADZALI, ROSFARIZA BINTI (2009) Electrical and Material Characterization of 0.24 micron CMOS Device by using Simulation. UNSPECIFIED.

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Item Type:	Other
PRISMA ID:	24004
URI:	http://oarr.uitm.edu.my/id/eprint/14081

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