Free-Space Microwave Characterization of Silicon Wafers For Microelectronic Applications

AWANG, ZAIKI BIN (2004) Free-Space Microwave Characterization of Silicon Wafers For Microelectronic Applications. In: UNSPECIFIED.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
PRISMA ID:	2225
URI:	http://oarr.uitm.edu.my/id/eprint/17202

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