Free space microwave characterization of silicon wafers for microelectronic applications

AWANG, ZAIKI BIN (2004) Free space microwave characterization of silicon wafers for microelectronic applications. In: UNSPECIFIED.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
PRISMA ID:	4679
URI:	http://oarr.uitm.edu.my/id/eprint/18085

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