Self Heating Characterization of 32V MOSFET using Pulsed Gate Measurement

RAHIM, ALHAN FARHANAH BINTI ABD (2006) Self Heating Characterization of 32V MOSFET using Pulsed Gate Measurement. In: UNSPECIFIED.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
PRISMA ID:	5790
URI:	http://oarr.uitm.edu.my/id/eprint/18645

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