ABDULLAH, WAN FAZLIDA HANIM BT (2002) Electrical Performance of 0.5 micron MOSFET on Bond-and-Etch-Back Silicon-On-Insulator (BESOI) Substrate. In: UNSPECIFIED.
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| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| PRISMA ID: | 23306 |
| URI: | http://oarr.uitm.edu.my/id/eprint/25125 |
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