Latch-up Characteristics of 0.5 micron CMOS Technology on Thick Bonded SOI Substrate

ABDULLAH, WAN FAZLIDA HANIM BT (2005) Latch-up Characteristics of 0.5 micron CMOS Technology on Thick Bonded SOI Substrate. In: UNSPECIFIED.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
PRISMA ID:	23310
URI:	http://oarr.uitm.edu.my/id/eprint/25129

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