Effect of Y2O3 content in a YSZ seed layer on crystallization of a low-temperature deposited Si film

HERMAN, SUKREEN HANA BINTI (2008) Effect of Y2O3 content in a YSZ seed layer on crystallization of a low-temperature deposited Si film. In: UNSPECIFIED.

Full text not available from this repository.

Metadata

Item Type:	Conference or Workshop Item (UNSPECIFIED)
PRISMA ID:	23409
URI:	http://oarr.uitm.edu.my/id/eprint/25171

Actions (login required)

View Item

Citation