Dependence of crystallization fraction of the low-temperature deposited Si film on the composition of the YSZ seed layer

HERMAN, SUKREEN HANA BINTI (2009) Dependence of crystallization fraction of the low-temperature deposited Si film on the composition of the YSZ seed layer. In: UNSPECIFIED.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
PRISMA ID:	23419
URI:	http://oarr.uitm.edu.my/id/eprint/25179

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