Structural characterization of AlN and AlGaN layers grown on GaN/AlN/Si 111 by plasma-assisted MBE

YUSOFF, MOHD ZAKI BIN MOHD (2009) Structural characterization of AlN and AlGaN layers grown on GaN/AlN/Si 111 by plasma-assisted MBE.

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Item Type:	Article
PRISMA ID:	39469
URI:	http://oarr.uitm.edu.my/id/eprint/3424

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