INVESTIGATION OF HOT CARRIER INDUCED DEGRADATION ON SUBMICRONMETER NMOS DEVICES

ZOOLFAKAR, AHMAD SABIRIN BIN (1994) INVESTIGATION OF HOT CARRIER INDUCED DEGRADATION ON SUBMICRONMETER NMOS DEVICES.

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Item Type:	Article
PRISMA ID:	25271
URI:	http://oarr.uitm.edu.my/id/eprint/372

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