Simulation and Characterization of 0.13um CMOS using Silicon-On-Insulator (SOI) Technology

RADZALI, ROSFARIZA BINTI (2005) Simulation and Characterization of 0.13um CMOS using Silicon-On-Insulator (SOI) Technology. ISSN 88-900775-8-1

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Item Type:	Article
PRISMA ID:	18130
URI:	http://oarr.uitm.edu.my/id/eprint/4959

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