Effect of single event upset on 6T and 12T static random access memory for different CMOS technologies
Static random access memory cells (SRAMs) are high-speed semiconductor memory that uses a flip-flop to store each bit. Almost four decades ago, the effect of radiation on this high-speed semiconductor device was discovered when the first satellite experienced serious issues caused by the high-energy...
| المؤلف الرئيسي: | |
|---|---|
| مؤلفون آخرون: | |
| التنسيق: | Master Thesis |
| اللغة: | الإنجليزية |
| منشور في: |
Kuala Lumpur :International Islamic University Malaysia,2017
2024
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| الموضوعات: | |
| الوصول للمادة أونلاين: | https://studentrepo.iium.edu.my/handle/123456789/7488 https://lib.iium.edu.my/mom/services/mom/document/getFile/RWcrtin04QEdagMBDKLcwbWvUKLuySJs20180410115705444 |
| Abstract | Abstract here |
