Design and analysis of electrical testing probe for semiconductor integrated circuit

In the field of Test and Measurement in Semiconductor industry, where measuring small resistances are necessary on Semiconductor IC (Integrated Circuit). Nowadays given the fact that electronics gadgets are evaluated become more advanced, the size of the gadgets is getting smaller and smaller, and...

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書目詳細資料

主要作者:	Wong, Michael Loke Peng
格式:	Thesis
語言:	英语 英语
出版:	2016
主題:	T Technology (General) TK Electrical engineering. Electronics Nuclear engineering
在線閱讀:	http://eprints.utem.edu.my/id/eprint/21105/1/Design%20And%20Analysis%20Of%20Electrical%20Testing%20Probe%20For%20Semiconductor%20Integrated%20Circuit.pdf http://eprints.utem.edu.my/id/eprint/21105/2/Design%20and%20analysis%20of%20electrical%20testing%20probe%20for%20semiconductor%20integrated%20circuit.pdf