Design and analysis of electrical testing probe for semiconductor integrated circuit

In the field of Test and Measurement in Semiconductor industry, where measuring small resistances are necessary on Semiconductor IC (Integrated Circuit). Nowadays given the fact that electronics gadgets are evaluated become more advanced, the size of the gadgets is getting smaller and smaller, and...

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主要作者:	Wong, Michael Loke Peng
格式:	Thesis
语言:	英语 英语
出版:	2016
主题:	T Technology (General) TK Electrical engineering. Electronics Nuclear engineering
在线阅读:	http://eprints.utem.edu.my/id/eprint/21105/1/Design%20And%20Analysis%20Of%20Electrical%20Testing%20Probe%20For%20Semiconductor%20Integrated%20Circuit.pdf http://eprints.utem.edu.my/id/eprint/21105/2/Design%20and%20analysis%20of%20electrical%20testing%20probe%20for%20semiconductor%20integrated%20circuit.pdf