Design and analysis of electrical testing probe for semiconductor integrated circuit

In the field of Test and Measurement in Semiconductor industry, where measuring small resistances are necessary on Semiconductor IC (Integrated Circuit). Nowadays given the fact that electronics gadgets are evaluated become more advanced, the size of the gadgets is getting smaller and smaller, and...

Description complète

Détails bibliographiques

Auteur principal:	Wong, Michael Loke Peng
Format:	Thèse
Langue:	anglais anglais
Publié:	2016
Sujets:	T Technology (General) TK Electrical engineering. Electronics Nuclear engineering
Accès en ligne:	http://eprints.utem.edu.my/id/eprint/21105/1/Design%20And%20Analysis%20Of%20Electrical%20Testing%20Probe%20For%20Semiconductor%20Integrated%20Circuit.pdf http://eprints.utem.edu.my/id/eprint/21105/2/Design%20and%20analysis%20of%20electrical%20testing%20probe%20for%20semiconductor%20integrated%20circuit.pdf