Software Modification in a Fault Analysis Tool for Critical Path Debugging

Microprocessor units caught with speed failure are becoming more and more eminent as the fabrication process shrinks according to Moore’s Law. Failure Analysis (FA) engineers confront the problem using Critical Path Debug method utilizing special IC (Integrated Circuit) test system capable of tes...

全面介紹

書目詳細資料
主要作者: Han, Chung Dean
格式: Thesis
語言:英语
英语
出版: 2009
在線閱讀:http://psasir.upm.edu.my/id/eprint/7360/1/FK_2009_50a.pdf