Multiple and solid data background scheme for testing static single cell faults on SRAM memories

Memory testing is a method that requires an algorithm capable of detecting faulty memory as comprehensively as possible to facilitate the efficient manufacture of fault free memory products. Therefore, the purpose of this thesis is to introduce a Data Background (DB) scheme to generate an optimal...

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Auteur principal:	Zakaria, Nor Azura
Format:	Thèse
Langue:	anglais
Publié:	2013
Sujets:	Metal oxide semiconductors, Complementary Computer storage devices - Design and construction
Accès en ligne:	http://psasir.upm.edu.my/id/eprint/84183/1/FK%202013%20142%20-%20ir.pdf