Multiple and solid data background scheme for testing static single cell faults on SRAM memories

Memory testing is a method that requires an algorithm capable of detecting faulty memory as comprehensively as possible to facilitate the efficient manufacture of fault free memory products. Therefore, the purpose of this thesis is to introduce a Data Background (DB) scheme to generate an optimal...

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书目详细资料

主要作者:	Zakaria, Nor Azura
格式:	Thesis
语言:	英语
出版:	2013
主题:	Metal oxide semiconductors, Complementary Computer storage devices - Design and construction
在线阅读:	http://psasir.upm.edu.my/id/eprint/84183/1/FK%202013%20142%20-%20ir.pdf