Abnormal control chart pattern classification optimisation using multi layered perceptron and bees algorithm

In today's industry, control charts are widely used to monitor production process. The abnormal patterns of a quality control chart could reveal problems that occur in the process. The abnormal patterns could be identified using nine existing shape features that assist the classification. These...

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Bibliographic Details
Main Author: Mitra Mahdani (P56085)
Other Authors: Noraidah Sahari, Prof. Dr.
Format: theses
Language:English
Published: UKM, Bangi 2023
Subjects:
Online Access:https://ptsldigital.ukm.my/jspui/handle/123456789/476376
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