Development Of Test Platform Of Fpga Interconnect To Capture Marginal Open Defect
This research highlights the development of test platform of FPGA interconnect to capture marginal open defect on Altera® Stratix V devices. The need for at-speed test was due to the increasing number of marginal open defects, resulting from manufacturing process complexity anticipated from continu...
| المؤلف الرئيسي: | |
|---|---|
| التنسيق: | أطروحة |
| اللغة: | الإنجليزية |
| منشور في: |
2015
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| الموضوعات: | |
| الوصول للمادة أونلاين: | http://eprints.usm.my/40813/ |
| Abstract | Abstract here |