Optimal Designs Of The Double Sampling X Chart Based On Parameter Estimation

Control charts, viewed as the most powerful and simplest tool in Statistical Process Control (SPC), are widely used in manufacturing and service industries. The double sampling (DS) X chart detects small to moderate process mean shifts effectively, while reduces the sample size. The convention...

詳細記述

書誌詳細
第一著者: Teoh, Wei Lin
フォーマット: 学位論文
言語:英語
出版事項: 2013
主題:
オンライン・アクセス:http://eprints.usm.my/43833/