Prediction Of Electrostatic Discharge Soft Error On Two-Way Radio Using Simulation And Immunity Scanning Technique

Electrostatic discharge (ESD) is a major cause of failures and malfunctions in two-way communication radio. Soft error failures like logic error, latch-up and wrong reset can occur as a result of the excessive ESD. It is a well-known fact that the Complementary Metal-Oxide- Semiconductor (CMOS) d...

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Bibliographic Details
Main Author: Antong, Rosnah
Format: Thesis
Language:English
Published: 2017
Subjects:
Online Access:http://eprints.usm.my/46419/
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