Thermal And Flicker Noise Analysis In Sample And Hold Circuit
In low-frequency applications, noise is becoming more of an issue as the MOS size reduced. Therefore, the flicker noise and thermal noise are one of the issues found in low-frequency applications. In this work, the thermal noise and flicker noise are modelled and measured on the sample-and-hold c...
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| Format: | Thesis |
| Language: | English |
| Published: |
2015
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| Online Access: | http://eprints.usm.my/46871/ |
| Abstract | Abstract here |