Thermal And Flicker Noise Analysis In Sample And Hold Circuit

In low-frequency applications, noise is becoming more of an issue as the MOS size reduced. Therefore, the flicker noise and thermal noise are one of the issues found in low-frequency applications. In this work, the thermal noise and flicker noise are modelled and measured on the sample-and-hold c...

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Bibliographic Details
Main Author:	Maniam, Balamurali
Format:	Thesis
Language:	English
Published:	2015
Subjects:	T Technology (General) TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Online Access:	http://eprints.usm.my/46871/
Abstract	Abstract here

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