Thermal And Flicker Noise Analysis In Sample And Hold Circuit

In low-frequency applications, noise is becoming more of an issue as the MOS size reduced. Therefore, the flicker noise and thermal noise are one of the issues found in low-frequency applications. In this work, the thermal noise and flicker noise are modelled and measured on the sample-and-hold c...

وصف كامل

التفاصيل البيبلوغرافية
المؤلف الرئيسي: Maniam, Balamurali
التنسيق: أطروحة
اللغة:الإنجليزية
منشور في: 2015
الموضوعات:
الوصول للمادة أونلاين:http://eprints.usm.my/46871/
Abstract Abstract here

مواد مشابهة