A Reference Based Surface Defect Segmentation Algorithm For Automatic Optical Inspection System
Surface defect segmentation algorithms in Automatic Optical Inspection (AOI) system for modern manufacturing industries provide solutions to quality control with speed, volume and traceability. However, present complex algorithms which are accurate require high processing power using a large size of...
| 第一著者: | |
|---|---|
| フォーマット: | 学位論文 |
| 言語: | 英語 |
| 出版事項: |
2020
|
| 主題: | |
| オンライン･アクセス: | http://eprints.usm.my/51673/ |
| Abstract | Abstract here |