A Reference Based Surface Defect Segmentation Algorithm For Automatic Optical Inspection System

Surface defect segmentation algorithms in Automatic Optical Inspection (AOI) system for modern manufacturing industries provide solutions to quality control with speed, volume and traceability. However, present complex algorithms which are accurate require high processing power using a large size of...

詳細記述

書誌詳細
第一著者: Wong, Ze-Hao
フォーマット: 学位論文
言語:英語
出版事項: 2020
主題:
オンライン・アクセス:http://eprints.usm.my/51673/
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