Oon, H. S. (2013). Growth And Physical Characterization Of Native Oxide Thin Film On N-Type Gallium Nitride Substrate By Ti-Iermal Oxidation In Nitrous Oxide Ambient.
Chicago Style (17th ed.) CitationOon, Hooi Shy. Growth And Physical Characterization Of Native Oxide Thin Film On N-Type Gallium Nitride Substrate By Ti-Iermal Oxidation In Nitrous Oxide Ambient. 2013.
MLA引文Oon, Hooi Shy. Growth And Physical Characterization Of Native Oxide Thin Film On N-Type Gallium Nitride Substrate By Ti-Iermal Oxidation In Nitrous Oxide Ambient. 2013.
警告:這些引文格式不一定是100%准確.
