Improving OEE data quality by automated data collection through identifying productivity potentials

Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE loss...

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書誌詳細

第一著者:	Karuppiah, K.Vasanthan
フォーマット:	学位論文
言語:	英語 英語
出版事項:	2017
主題:	T Technology (General) TS Manufactures
オンライン･アクセス:	http://eprints.utem.edu.my/id/eprint/20972/ https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104936
Abstract	Abstract here