Improving OEE data quality by automated data collection through identifying productivity potentials

Most semiconductor organizations take after the SEMI standard rules to gauge equipment availability and utilization by means of Overall Equipment Effectiveness (OEE). Be that as it may, a few issues should be vanquished to get improve data accuracy of OEE. For instance, the time interims of OEE loss...

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主要作者:	Karuppiah, K.Vasanthan
格式:	Thesis
語言:	英语 英语
出版:	2017
主題:	T Technology (General) TS Manufactures
在線閱讀:	http://eprints.utem.edu.my/id/eprint/20972/ https://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=104936
Abstract	Abstract here