Remote global alignment error for cycle time improvement of pad inductor layer

Lithography is the key process which transfers the pattern from mask (reticle) to wafer; and pad inductor layer is the last layer in photo masking. The cycle time for pad inductor layer has increased in Silterra Malaysia Sdn. Bhd., by 32% per month due to Global Alignment (GA) error. Meanwhile, engi...

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Détails bibliographiques
Auteur principal: Devadas, Saandilian
Format: Thèse
Langue:anglais
anglais
Publié: 2018
Sujets:
Accès en ligne:http://eprints.utem.edu.my/id/eprint/23781/
http://plh.utem.edu.my/cgi-bin/koha/opac-detail.pl?biblionumber=112889
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