Style de citation APA (7e éd.)

Abdullah, F. (2013). Technique of failure analysis for gate oxide defect of Bi-polar CMOS Diffuse (BCD) technology.

Style de citation Chicago (17e éd.)

Abdullah, Farisal. Technique of Failure Analysis for Gate Oxide Defect of Bi-polar CMOS Diffuse (BCD) Technology. 2013.

Style de citation MLA (9e éd.)

Abdullah, Farisal. Technique of Failure Analysis for Gate Oxide Defect of Bi-polar CMOS Diffuse (BCD) Technology. 2013.

Attention : ces citations peuvent ne pas être correctes à 100%.