Random power supply as a test vector to expose soft defects in CMOS digital circuits
| मुख्य लेखक: | Kamisian, Izam |
|---|---|
| स्वरूप: | थीसिस |
| प्रकाशित: |
2000
|
| विषय: |
समान संसाधन
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The Design of Low Power CMOS SRAM Subsystems
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समान संसाधन
-
Analysis on layout dependent defects of CMOS digital circuit
द्वारा: Mat Safri, Norlaili
प्रकाशित: (1999) -
Low power cmos potentiometric circuit design for label-free DNA detection
द्वारा: Khalid, Muhammad Harris
प्रकाशित: (2019) -
Test vectors reductoin for integrated circuit testing using horizontal hamming distance
द्वारा: Alamgir, Arbab
प्रकाशित: (2016) -
Fault Analysis And Test For Bridge Defect In Resistive Random Access Memory
द्वारा: Arshad, Norsuhaidah
प्रकाशित: (2016) -
Development of Test Procedure For CMOS Operational Amplifier Application Circuits
द्वारा: Abdul Halin, Izhal
प्रकाशित: (2002)